I. Crupi

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2005

1 E. Spitale, D. Corso, I. Crupi, Salvatore Lombardo, Cosimo Gerardi: Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectronics Reliability 45(5-6): 895-898 (2005)

	2005
1		E. Spitale, D. Corso, I. Crupi, Salvatore Lombardo, Cosimo Gerardi: Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectronics Reliability 45(5-6): 895-898 (2005)

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