Brian C. Crosby

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1984

3 Brian C. Crosby: Adapting CAE Design Information for In-Circuit Test Generation. ITC 1984: 206-211

1983

2 Brian C. Crosby: FAST Technology In-Circuit Testing Considerations. ITC 1983: 51-56

1982

1 Brian C. Crosby: ECL Board Testing: An In-Circuit Point of View. ITC 1982: 609-614

	1984
3		Brian C. Crosby: Adapting CAE Design Information for In-Circuit Test Generation. ITC 1984: 206-211
	1983
2		Brian C. Crosby: FAST Technology In-Circuit Testing Considerations. ITC 1983: 51-56
	1982
1		Brian C. Crosby: ECL Board Testing: An In-Circuit Point of View. ITC 1982: 609-614

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