Adam Cron

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2006

4 Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg: Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC 2006: 1-9

2004

3 Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191

1997

2 Adam Cron: IEEE P1149.4-Almost a Standard. ITC 1997: 174-182

1996

1 Adam Cron: A D&T Special Report: P1149.4 Mixed-Signal Test Bus. IEEE Design & Test of Computers 13(3): 98-101 (1996)

	2006
4		Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg: Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC 2006: 1-9
	2004
3		Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191
	1997
2		Adam Cron: IEEE P1149.4-Almost a Standard. ITC 1997: 174-182
	1996
1		Adam Cron: A D&T Special Report: P1149.4 Mixed-Signal Test Bus. IEEE Design & Test of Computers 13(3): 98-101 (1996)

Coauthor Index

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team —

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1	Carl Barnhart	[3]
2	Ben Bennetts (R. G. Bennetts)	[3]
3	Dave Bonnett	[3]
4	Heiko Ehrenberg	[4]
5	Bill Eklow (William Eklow)	[3]
6	Neil Jacobson	[3]
7	Adam W. Ley	[4]
8	Adam Osseiran	[3]
9	Stephen K. Sunter (Steve Sunter)	[3]
10	Bambang Suparjo	[4]