Kristof Croes

	2008
2		Jin Guo, Antonis Papanikolaou, Michele Stucchi, Kristof Croes, Zsolt Tokei, Francky Catthoor: A tool flow for predicting system level timing failures due to interconnect reliability degradation. ACM Great Lakes Symposium on VLSI 2008: 291-296
1		Kristof Croes, G. Cannatá, L. Zhao, Zsolt Tokei: Study of copper drift during TDDB of intermetal dielectrics by using fully passivated MOS capacitors as test vehicle. Microelectronics Reliability 48(8-9): 1384-1387 (2008)

Coauthor Index

1	G. Cannatá	[1]
2	Francky Catthoor	[2]
3	Jin Guo	[2]
4	Antonis Papanikolaou	[2]
5	Michele Stucchi	[2]
6	Zsolt Tokei	[1] [2]
7	L. Zhao	[1]

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