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| 2011 | ||
|---|---|---|
| 3 | Kiichi Tachi, Sylvain Barraud, Kuniyuki Kakushima, Hiroshi Iwai, Sorin Cristoloveanu, Thomas Ernst: Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs. Microelectronics Reliability 51(5): 885-888 (2011) | |
| 2007 | ||
| 2 | Kerem Akarvardar, Abdelkarim Mercha, Eddy Simoen, Vaidyanathan Subramanian, Cor Claeys, Pierre Gentil, Sorin Cristoloveanu: High-temperature performance of state-of-the-art triple-gate transistors. Microelectronics Reliability 47(12): 2065-2069 (2007) | |
| 2005 | ||
| 1 | Amir Fijany, Farrokh Vatan, Mohammad M. Mojarradi, Nikzad Benny Toomarian, Benjamin J. Blalock, Kerem Akarvardar, Sorin Cristoloveanu, Pierre Gentil: The G4-FET: a universal and programmable logic gate. ACM Great Lakes Symposium on VLSI 2005: 349-352 | |
Colors in the list of coauthors
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