B. Cretu

	2002
2		B. Cretu, Francis Balestra, G. Ghibaudo, G. Guégan: Origin of hot carrier degradation in advanced nMOSFET devices. Microelectronics Reliability 42(9-11): 1405-1408 (2002)
	2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, Jalal Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	Francis Balestra	[2]
2	T. Devoivre	[1]
3	M. Fadlallah	[1]
4	Gérard Ghibaudo (G. Ghibaudo)	[1] [2]
5	C. Giannakopoulos	[1]
6	G. Guégan	[2]
7	Jalal Jomaah	[1]
8	F. Monsieur	[1]
9	A. Szewczyk	[1]

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