S. Cremoux

	1996
1		S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301

Coauthor Index

1	Christophe Fagot	[1]
2	Patrick Girard	[1]
3	Christian Landrault	[1]
4	Serge Pravossoudovitch	[1]

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