S. Crémer

	2005
2		E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005)
	2003
1		C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent: MIM capacitance variation under electrical stress. Microelectronics Reliability 43(8): 1237-1240 (2003)

Coauthor Index

1	S. Bécu	[2]
2	C. Besset	[1]
3	S. Blonkowski	[1] [2]
4	S. Bruyère	[1] [2]
5	E. Deloffre	[2]
6	Gérard Ghibaudo (G. Ghibaudo)	[2]
7	M. Gros-Jean	[2]
8	L. Montès	[2]
9	E. Vincent	[1]

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