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Henry Cox Coauthor index pubzone.org

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DBLP keys1995
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox: Synthesizing Circuits with Implicit Testability Constraints. IEEE Design & Test of Computers 12(2): 16-23 (1995)
1994
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox: On Synthesizing Circuits With Implicit Testability Constraints. ITC 1994: 989-998
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox, Janusz Rajski: On necessary and nonconflicting assignments in algorithmic test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 13(4): 515-530 (1994)
1990
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJanusz Rajski, Henry Cox: A method to calculate necessary assignments in algorithmic test pattern generation. ITC 1990: 25-34
1988
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski: On Multiple Fault Coverage and Aliasing Probability Measures. ITC 1988: 314-321
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox, Janusz Rajski: Stuck-Open and Transition Fault Testing in CMOS Complex Gates. ITC 1988: 688-694
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHenry Cox, Janusz Rajski: A method of fault analysis for test generation and fault diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 7(7): 813-833 (1988)

Coauthor Index

1Vinod K. Agarwal [3]
2André Ivanov [3]
3Janusz Rajski [1] [2] [3] [4] [5]

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