Paolo Cova

P. Cova

	2010
11		F. Bertoluzza, Paolo Cova, Nicola Delmonte, P. Pampili, M. Portesine: Coupled measurement-simulation procedure for very high power fast recovery - Soft behavior diode design and testing. Microelectronics Reliability 50(9-11): 1720-1724 (2010)
10		Mirko Bernardoni, Nicola Delmonte, Paolo Cova, Roberto Menozzi: Thermal modeling of planar transformer for switching power converters. Microelectronics Reliability 50(9-11): 1778-1782 (2010)
	2009
9		Mirko Bernardoni, Paolo Cova, Nicola Delmonte, Roberto Menozzi: Heat management for power converters in sealed enclosures: A numerical study. Microelectronics Reliability 49(9-11): 1293-1298 (2009)
	2008
8		P. Cova, Nicola Delmonte, Roberto Menozzi: Thermal modeling of high frequency DC-DC switching modules: Electromagnetic and thermal simulation of magnetic components. Microelectronics Reliability 48(8-9): 1468-1472 (2008)
	2007
7		Nicola Delmonte, B. E. Watts, G. Chiorboli, P. Cova, Roberto Menozzi: Test structures for dielectric spectroscopy of thin films at microwave frequencies. Microelectronics Reliability 47(4-5): 682-685 (2007)
	2006
6		P. Cova, Roberto Menozzi, M. Portesine: Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectronics Journal 37(5): 409-416 (2006)
5		Paolo Cova, Nicola Delmonte, Roberto Menozzi: Thermal characterization and modeling of power hybrid converters for distributed power systems. Microelectronics Reliability 46(9-11): 1760-1765 (2006)
	2005
4		Paolo Cova, Nicola Delmonte, Roberto Menozzi: On state breakdown in PHEMTs and its temperature dependence. Microelectronics Reliability 45(9-11): 1605-1610 (2005)
	2003
3		P. Cova, Roberto Menozzi, M. Portesine: Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery. Microelectronics Reliability 43(1): 81-87 (2003)
	2002
2		P. Cova, Roberto Menozzi, M. Dammann, T. Feltgen, W. Jantz: High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. Microelectronics Reliability 42(9-11): 1587-1592 (2002)
1		Mauro Ciappa, Flavio Carbognani, P. Cova, Wolfgang Fichtner: A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. Microelectronics Reliability 42(9-11): 1653-1658 (2002)

Coauthor Index

1	Mirko Bernardoni	[9] [10]
2	F. Bertoluzza	[11]
3	Flavio Carbognani	[1]
4	G. Chiorboli	[7]
5	Mauro Ciappa	[1]
6	M. Dammann	[2]
7	Nicola Delmonte	[4] [5] [7] [8] [9] [10] [11]
8	T. Feltgen	[2]
9	Wolfgang Fichtner	[1]
10	W. Jantz	[2]
11	Roberto Menozzi	[2] [3] [4] [5] [6] [7] [8] [9] [10]
12	P. Pampili	[11]
13	M. Portesine	[3] [6] [11]
14	B. E. Watts	[7]

Colors in the list of coauthors

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