Bernard Courtois

	2012
60		Bernard Courtois: Special section NANOTECH 2011. Microelectronics Journal 43(5): 299 (2012)
	2009
59		Bernard Courtois, Kholdoun Torki, S. Dumont, S. Eyraud, J.-F. Paillotin, Gregory di Pendina: Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566
58		Bernard Courtois, Chandu Visweswariah: Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. VTS 2009: 237
57		Bernard Courtois, Ali Shakouri: Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. VTS 2009: 241
56		Bernard Courtois: European Nano Systems 2007. Microelectronics Journal 40(4-5): 655 (2009)
	2008
55		Bernard Courtois: European Nano Systems 2006. Microelectronics Journal 39(8): 1031 (2008)
	2007
54		Peter Szabó, Balázs Németh, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007)
	2006
53		Bernard Courtois: Session Abstract. VTS 2006: 150-151
	2005
52		Bernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005)
	2004
51		Bernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156
50		Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
	2003
49		Bernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): 318-326 (2003)
	2001
48		Kholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6-
47		Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
46		Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)
	2000
45		Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
44		Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
43		Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)
42		Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
	1999
41		Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
40		Kholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5
39		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
38		Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
	1998
37		Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-528
36		S. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58
35		A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
34		Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
33		Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
32		Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
	1997
31		Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
30		Klaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112
29		Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
28		Jean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997)
	1996
27		Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
26		Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)
25		Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996)
24		Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)
23		Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)
22		Bozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)
	1995
21		Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-
20		Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
19		Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)
18		Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
17		Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
	1994
16		Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
	1993
15		F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600
	1992
14		Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
13		Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
	1991
12		Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251
11		M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247
	1990
10		P. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas: NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609
	1989
9		Michael Nicolaidis, S. Noraz, Bernard Courtois: A generalized theory of fail-safe systems. FTCS 1989: 398-406
8		René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)
	1988
7		Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101
6		Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988)
5		Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)
	1986
4		Ahmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721
3		J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473
	1984
2		H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403
	1981
1		Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30

Coauthor Index

1	S. J. Abou-Samra	[36]
2	Vishwani D. Agrawal	[21]
3	P. A. Aisa	[36]
4	Vladimir Castro Alves	[12]
5	L. Bergher	[3]
6	R. D. (Shawn) Blanton (Ronald D. Blanton)	[38]
7	P. Bondono	[10]
8	D. Bonifas	[10]
9	Hicham Boutamine	[28] [31]
10	Jean Paul Caisso	[7]
11	A. Castillejo	[35]
12	Sreejit Chakravarty	[19]
13	Benoît Charlot	[41] [43] [45] [46] [47]
14	P. Pal Chaudhuri	[21]
15	Jacques P. Collin	[3]
16	Philippe Coste	[45]
17	Érika F. Cota	[37] [41]
18	René David	[8]
19	P. Drake	[31]
20	S. Dumont	[59]
21	S. Eyraud	[59]
22	Antoine Fuentes	[8]
23	Manfred Glesner	[30] [31] [39]
24	Alain Guyot	[36]
25	Sybille Hellebrand	[14] [18]
26	Fumiyasu Hirose	[21]
27	Klaus Hofmann	[30] [31] [39]
28	A. Hornik	[10]
29	R. Jamier	[4]
30	Ingrid Jansch	[6]
31	Ahmed Amine Jerraya	[4] [10] [45]
32	Bozena Kaminska	[19] [20] [22] [26]
33	Jean-Michel Karam	[27] [28] [30] [31] [32] [35] [39]
34	Vladimir Kolarik	[16] [17] [44]
35	Sandip Kundu	[21]
36	J. Laurent	[3] [11]
37	Chung-Len Lee	[21]
38	P. Lestrat	[12]
39	Marcelo Lubaszewski	[13] [16] [17] [20] [23] [24] [27] [32] [33] [37] [39] [41] [44]
40	A. Manolescu	[30]
41	Santiago Marco	[30]
42	M. Marzouki	[11]
43	Yinghua Min	[21]
44	Salvador Mir	[16] [17] [23] [24] [35] [39] [41] [43] [44] [45] [46] [47] [50]
45	Balázs Németh	[54]
46	Michael Nicolaidis	[5] [9] [12] [15]
47	Gabriela Nicolescu	[45]
48	C. Nielsen	[16] [44]
49	S. Noraz	[9]
50	J.-F. Paillotin	[59]
51	Fabien Parrain	[45] [46] [47]
52	Gregory di Pendina	[59]
53	Gil Philips	[19]
54	András Poppe	[31]
55	Janusz Rajski	[14] [18]
56	Márta Rencz	[27] [29] [31] [32] [34] [39] [42] [45] [54]
57	Libor Rufer	[50]
58	Khaled Saab	[20]
59	H. Sahami	[2]
60	Josep Samitier	[30]
61	Nicu Sebe	[30]
62	Ali Shakouri	[57]
63	Ramalingam Sridhar	[19]
64	Peter Szabó	[54]
65	Vladimir Székely	[27] [29] [31] [32] [34] [39] [42]
66	Steffen Tarnick	[14] [18]
67	Kholdoun Torki	[40] [42] [48] [59]
68	S. Török	[42]
69	Shambhu J. Upadhyaya	[19]
70	F. L. Vargas	[15]
71	P. Varinot	[4]
72	Srikanth Venkataraman	[18]
73	D. Veychard	[35]
74	Chandu Visweswariah	[58]
75	Nacer-Eddine Zergainoh	[45]
76	Yervant Zorian	[19]

Colors in the list of coauthors

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page