Didier Cottet

	2002
3		Didier Cottet, Michael Scheffler, Gerhard Tröster: A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels. Microelectronics Reliability 42(3): 417-426 (2002)
	2001
2		Michael Scheffler, Didier Cottet, Gerhard Tröster: A simplified yield modeling method for design rule trade-off in interconnection substrates. Microelectronics Reliability 41(6): 861-869 (2001)
	2000
1		Rolf Enzler, Tobias Jeger, Didier Cottet, Gerhard Tröster: High-Level Area and Performance Estimation of Hardware Building Blocks on FPGAs. FPL 2000: 525-534

Coauthor Index

1	Rolf Enzler	[1]
2	Tobias Jeger	[1]
3	Michael Scheffler	[2] [3]
4	Gerhard Tröster	[1] [2] [3]

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