Jean-Francois Cote

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2008

3 Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote: Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. ITC 2008: 1-10

2004

2 Stephen K. Sunter, Aubin Roy, Jean-Francois Cote: An Automated, Complete, Structural Test Solution for SERDES. ITC 2004: 95-104

1999

1 Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras: An embedded technique for at-speed interconnect testing. ITC 1999: 431-438

	2008
3		Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote: Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. ITC 2008: 1-10
	2004
2		Stephen K. Sunter, Aubin Roy, Jean-Francois Cote: An Automated, Complete, Structural Test Solution for SERDES. ITC 2004: 95-104
	1999
1		Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras: An embedded technique for at-speed interconnect testing. ITC 1999: 431-438

Coauthor Index

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team —

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1	Harry Hulvershorn	[1]
2	Benoit Nadeau-Dostie	[1] [3]
3	Stephen Pateras	[1]
4	Aubin Roy	[2]
5	Stephen K. Sunter (Steve Sunter)	[2]
6	Kiyoshi Takeshita	[3]