 | 2005 |
|---|
| 7 |       | Chris Schuermyer,
Kevin Cota,
Robert Madge,
Brady Benware:
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.
ITC 2005: 9 |
| 2003 |
|---|
| 6 | | Chris Schuermyer,
Brady Benware,
Kevin Cota,
Robert Madge,
W. Robert Daasch,
L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC 2003: 565-573 |
| 2002 |
|---|
| 5 | | W. Robert Daasch,
Kevin Cota,
James McNames,
Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.
ITC 2002: 1240 |
| 4 | | Robert Madge,
Manu Rehani,
Kevin Cota,
W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
VTS 2002: 69-74 |
| 3 | | W. Robert Daasch,
James McNames,
Robert Madge,
Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.
IEEE Design & Test of Computers 19(5): 74-81 (2002) |
| 2001 |
|---|
| 2 | | W. Robert Daasch,
Kevin Cota,
James McNames,
Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data.
ITC 2001: 92-100 |
| 2000 |
|---|
| 1 | | W. Robert Daasch,
James McNames,
Daniel Bockelman,
Kevin Cota:
Variance reduction using wafer patterns in I_ddQ data.
ITC 2000: 189-198 |
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