Bruce Cory

	2012
7		Sounil Biswas, Bruce Cory: An Industrial Study of System-Level Test. IEEE Design & Test of Computers 29(1): 19-27 (2012)
	2011
6		Cathy Kardach, I. Kapilevich, J. Block, Ted Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory: Foundry workflow for dynamic-EFA-based yield ramp. Microelectronics Reliability 51(9-11): 1668-1672 (2011)
	2010
5		Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng: Scan chain failure analysis using laser voltage imaging. Microelectronics Reliability 50(9-11): 1422-1426 (2010)
	2006
4		Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie: OCI: Open Compression Interface. ITC 2006: 1-4
3		Roger Nicholson, Cathy Kardach, Bruce Cory: The Role of ATPG Fault Diagnostics in Driving Physical Analysis. ITC 2006: 1-7
	2005
2		Bruce Cory: Needs fabless yield ramp foundry partnership to be most successful. ITC 2005: 1
	2003
1		Bruce Cory, Rohit Kapur, Bill Underwood: Speed Binning with Path Delay Test in 150-nm Technology. IEEE Design & Test of Computers 20(5): 41-45 (2003)

Coauthor Index

1	Sounil Biswas	[7]
2	J. Block	[6]
3	Dwayne Burek	[4]
4	I. Kapilevich	[6]
5	Rohit Kapur	[1] [4]
6	Cathy Kardach	[3] [6]
7	Steven Kasapi	[5] [6]
8	Mark Kassab	[4]
9	Brion L. Keller	[4]
10	Kee Sup Kim	[4]
11	J. Liao	[6]
12	Joy Y. Liao	[5]
13	Ted Lundquist	[6]
14	Howard L. Marks	[5]
15	Benoit Nadeau-Dostie	[4]
16	Yin S. Ng	[5] [6]
17	Roger Nicholson	[3]
18	Steven F. Oakland	[4]
19	Mick Tegethoff	[4]
20	Bill Underwood	[1]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page