 | 2012 |
| 5 |  | I. Cortés,
G. Toulon,
F. Morancho,
E. Hugonnard-Bruyere,
B. Villard,
W. J. Toren:
Analysis and optimization of lateral thin-film Silicon-on-insulator (SOI) MOSFET transistors.
Microelectronics Reliability 52(3): 503-508 (2012) |
| 2008 |
| 4 |  | I. Cortés,
P. Fernández-Martínez,
D. Flores,
S. Hidalgo,
J. Rebollo:
Superjunction LDMOS on thick-SOI technology for RF applications.
Microelectronics Journal 39(6): 922-927 (2008) |
| 3 |  | I. Cortés,
P. Fernández-Martínez,
D. Flores,
S. Hidalgo,
J. Rebollo:
Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors.
Microelectronics Reliability 48(2): 173-180 (2008) |
| 2005 |
| 2 |  | I. Cortés,
J. Roig,
D. Flores,
J. Urresti,
S. Hidalgo,
J. Rebollo:
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.
Microelectronics Reliability 45(3-4): 493-498 (2005) |
| 1 |  | J. Urresti,
S. Hidalgo,
D. Flores,
J. Roig,
I. Cortés,
J. Rebollo:
Lateral punch-through TVS devices for on-chip protection in low-voltage applications.
Microelectronics Reliability 45(7-8): 1181-1186 (2005) |