D. Corso

	2010
3		S. Libertino, D. Corso, G. Murè, A. Marino, F. Palumbo, F. Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, M. Lisiansky, Y. Roizin, Salvatore Lombardo: Radiation effects in nitride read-only memories. Microelectronics Reliability 50(9-11): 1857-1860 (2010)
	2007
2		D. Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino: Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectronics Reliability 47(4-5): 806-809 (2007)
	2005
1		E. Spitale, D. Corso, I. Crupi, Salvatore Lombardo, Cosimo Gerardi: Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectronics Reliability 45(5-6): 895-898 (2005)

Coauthor Index

1	S. Aurite	[2]
2	G. Cannella	[3]
3	S. Cascino	[2]
4	F. Celi	[3]
5	I. Crupi	[1]
6	Cosimo Gerardi	[1]
7	S. Giarusso	[3]
8	S. Libertino	[3]
9	M. Lisiansky	[3]
10	Salvatore Lombardo	[1] [2] [3]
11	A. Marino	[3]
12	G. Murè	[3]
13	D. Naso	[2]
14	M. C. Nicotra	[2]
15	F. Palumbo	[3]
16	F. Principato	[3]
17	Y. Roizin	[3]
18	A. Santangelo	[2]
19	T. Schillaci	[3]
20	E. Sciacca	[2]
21	E. Spitale	[1]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page