Mariane Comte

	2011
14		Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell: Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electronic Testing 27(3): 335-350 (2011)
	2009
13		Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker: An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26
	2008
12		Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker: A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. European Test Symposium 2008: 113-118
11		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib: ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: (2008)
	2007
10		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
9		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Computers & Digital Techniques 1(3): 146-153 (2007)
	2006
8		Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell: Electrical Behavior of GOS Fault affected Domino Logic Cell. DELTA 2006: 183-189
7		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
6		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
	2005
5		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
	2004
4		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electronic Testing 20(3): 257-267 (2004)
3		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electronic Testing 20(4): 375-387 (2004)
	2003
2		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
1		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)

Coauthor Index

1	Florence Azaïs	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [14]
2	Bernd Becker	[12] [13]
3	Serge Bernard	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [14]
4	Yves Bertrand	[1] [2] [3] [4] [5]
5	Philippe Cauvet	[6] [7] [9] [10] [11] [14]
6	Omar Chakib	[11]
7	Alejandro Czutro	[12] [13]
8	Piet Engelke	[12] [13]
9	Hideo Fujiwara	[8]
10	Nicolas Houarche	[12] [13]
11	Vincent Kerzerho	[6] [7] [9] [10] [11] [14]
12	Satoshi Ohtake	[8]
13	Ilia Polian	[12] [13]
14	Michel Renovell	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14]

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