P. Colson

	2001
1		Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens: Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectronics Reliability 41(9-10): 1403-1407 (2001)

Coauthor Index

1	Jan Ackaert	[1]
2	Eddy De Backer	[1]
3	Peter Coppens	[1]
4	Z. Wang	[1]

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