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| 2010 | ||
|---|---|---|
| 1 | Sholom M. Weiss, Robert J. Baseman, Fateh Tipu, Christopher N. Collins, William A. Davies, Raminderpal Singh, John W. Hopkins: Rule-based data mining for yield improvement in semiconductor manufacturing. Appl. Intell. 33(3): 318-329 (2010) | |
| 1 | Robert J. Baseman | [1] |
| 2 | William A. Davies | [1] |
| 3 | John W. Hopkins | [1] |
| 4 | Raminderpal Singh | [1] |
| 5 | Fateh Tipu | [1] |
| 6 | Sholom M. Weiss | [1] |
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