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| 1986 | ||
|---|---|---|
| 1 | J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473 | |
| 1 | L. Bergher | [1] |
| 2 | Bernard Courtois | [1] |
| 3 | J. Laurent | [1] |
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