Randall S. Collica

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1994

2 Brenda S. Cantell, Randall S. Collica, José G. Ramírez: Statistical analysis of Particle/Defect Data Experiments Using Poisson and Logistic Regression. DFT 1994: 230-238

1993

1 Randall S. Collica: A Logistic Regression Yield Model for SRAM Bit Fail Patterns. DFT 1993: 127-135

	1994
2		Brenda S. Cantell, Randall S. Collica, José G. Ramírez: Statistical analysis of Particle/Defect Data Experiments Using Poisson and Logistic Regression. DFT 1994: 230-238
	1993
1		Randall S. Collica: A Logistic Regression Yield Model for SRAM Bit Fail Patterns. DFT 1993: 127-135

Coauthor Index

1 Brenda S. Cantell [2]

2 José G. Ramírez [2]

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