J. P. Colinge

	2001
1		Xiaohui Tang, X. Baie, J. P. Colinge, P. Loumaye, C. Renaux, Vincent Bayot: Influence of device geometry on SOI single-hole transistor characteristics. Microelectronics Reliability 41(11): 1841-1846 (2001)

Coauthor Index

1	X. Baie	[1]
2	Vincent Bayot	[1]
3	P. Loumaye	[1]
4	C. Renaux	[1]
5	Xiaohui Tang	[1]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page