 | 2012 |
| 13 |  | Jinyu Ruan,
Nicolas Monnereau,
David Trémouilles,
Nicolas Mauran,
Fabio Coccetti,
Nicolas Nolhier,
Robert Plana:
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.
IEEE T. Instrumentation and Measurement 61(2): 456-461 (2012) |
| 2011 |
| 12 |  | Usama Zaghloul,
George Papaioannou,
Bharat Bhushan,
Fabio Coccetti,
Patrick Pons,
Robert Plana:
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].
Microelectronics Reliability 51(12): 2416 (2011) |
| 11 |  | Usama Zaghloul,
George Papaioannou,
Bharat Bhushan,
Fabio Coccetti,
Patrick Pons,
Robert Plana:
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Microelectronics Reliability 51(9-11): 1810-1818 (2011) |
| 2010 |
| 10 |  | Usama Zaghloul,
M. Koutsoureli,
H. Wang,
Fabio Coccetti,
George Papaioannou,
Patrick Pons,
Robert Plana:
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Microelectronics Reliability 50(9-11): 1615-1620 (2010) |
| 9 |  | Mohamed Matmat,
K. Koukos,
Fabio Coccetti,
T. Idda,
Antoine Marty,
Christophe Escriba,
Jean-Yves Fourniols,
Daniel Estève:
Life expectancy and characterization of capacitive RF MEMS switches.
Microelectronics Reliability 50(9-11): 1692-1696 (2010) |
| 2009 |
| 8 |  | Jinyu Ruan,
Nicolas Nolhier,
G. J. Papaioannou,
D. Trémouilles,
Vincent Puyal,
C. Villeneuve,
T. Idda,
Fabio Coccetti,
Robert Plana:
Accelerated lifetime test of RF-MEMS switches under ESD stress.
Microelectronics Reliability 49(9-11): 1256-1259 (2009) |
| 7 |  | Mohamed Matmat,
Fabio Coccetti,
Antoine Marty,
Robert Plana,
Christophe Escriba,
Jean-Yves Fourniols,
Daniel Estève:
Capacitive RF MEMS analytical predictive reliability and lifetime characterization.
Microelectronics Reliability 49(9-11): 1304-1308 (2009) |
| 6 |  | Usama Zaghloul,
George Papaioannou,
Fabio Coccetti,
Patrick Pons,
Robert Plana:
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Microelectronics Reliability 49(9-11): 1309-1314 (2009) |
| 2008 |
| 5 |  | Jinyu Ruan,
G. J. Papaioannou,
Nicolas Nolhier,
Nicolas Mauran,
M. Bafleur,
Fabio Coccetti,
Robert Plana:
ESD failure signature in capacitive RF MEMS switches.
Microelectronics Reliability 48(8-9): 1237-1240 (2008) |
| 4 |  | Jinyu Ruan,
E. Papandreou,
M. Lamhamdi,
M. Koutsoureli,
Fabio Coccetti,
Patrick Pons,
George Papaioannou,
Robert Plana:
Alpha particle radiation effects in RF MEMS capacitive switches.
Microelectronics Reliability 48(8-9): 1241-1244 (2008) |
| 3 |  | M. Lamhamdi,
Patrick Pons,
Usama Zaghloul,
L. Boudou,
Fabio Coccetti,
J. Guastavino,
Y. Segui,
George Papaioannou,
Robert Plana:
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
Microelectronics Reliability 48(8-9): 1248-1252 (2008) |
| 2007 |
| 2 |  | Jinyu Ruan,
Nicolas Nolhier,
M. Bafleur,
L. Bary,
Fabio Coccetti,
T. Lisec,
Robert Plana:
Electrostatic discharge failure analysis of capacitive RF MEMS switches.
Microelectronics Reliability 47(9-11): 1818-1822 (2007) |
| 2005 |
| 1 |  | M. Exarchos,
V. Theonas,
Patrick Pons,
G. J. Papaioannou,
S. Mellé,
David Dubuc,
Fabio Coccetti,
Robert Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |