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Fabio Coccetti Coauthor index pubzone.org

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DBLP keys2012
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJinyu Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana: An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE T. Instrumentation and Measurement 61(2): 456-461 (2012)
2011
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLUsama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana: Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectronics Reliability 51(12): 2416 (2011)
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLUsama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana: On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectronics Reliability 51(9-11): 1810-1818 (2011)
2010
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLUsama Zaghloul, M. Koutsoureli, H. Wang, Fabio Coccetti, George Papaioannou, Patrick Pons, Robert Plana: Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectronics Reliability 50(9-11): 1615-1620 (2010)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève: Life expectancy and characterization of capacitive RF MEMS switches. Microelectronics Reliability 50(9-11): 1692-1696 (2010)
2009
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJinyu Ruan, Nicolas Nolhier, G. J. Papaioannou, D. Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana: Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectronics Reliability 49(9-11): 1256-1259 (2009)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève: Capacitive RF MEMS analytical predictive reliability and lifetime characterization. Microelectronics Reliability 49(9-11): 1304-1308 (2009)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLUsama Zaghloul, George Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana: Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectronics Reliability 49(9-11): 1309-1314 (2009)
2008
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJinyu Ruan, G. J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, M. Bafleur, Fabio Coccetti, Robert Plana: ESD failure signature in capacitive RF MEMS switches. Microelectronics Reliability 48(8-9): 1237-1240 (2008)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJinyu Ruan, E. Papandreou, M. Lamhamdi, M. Koutsoureli, Fabio Coccetti, Patrick Pons, George Papaioannou, Robert Plana: Alpha particle radiation effects in RF MEMS capacitive switches. Microelectronics Reliability 48(8-9): 1241-1244 (2008)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Lamhamdi, Patrick Pons, Usama Zaghloul, L. Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George Papaioannou, Robert Plana: Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectronics Reliability 48(8-9): 1248-1252 (2008)
2007
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJinyu Ruan, Nicolas Nolhier, M. Bafleur, L. Bary, Fabio Coccetti, T. Lisec, Robert Plana: Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectronics Reliability 47(9-11): 1818-1822 (2007)
2005
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Exarchos, V. Theonas, Patrick Pons, G. J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana: Investigation of charging mechanisms in metal-insulator-metal structures. Microelectronics Reliability 45(9-11): 1782-1785 (2005)

Coauthor Index

1M. Bafleur [2] [5]
2L. Bary [2]
3Bharat Bhushan [11] [12]
4L. Boudou [3]
5David Dubuc [1]
6Christophe Escriba [7] [9]
7Daniel Estève [7] [9]
8M. Exarchos [1]
9Jean-Yves Fourniols [7] [9]
10J. Guastavino [3]
11T. Idda [8] [9]
12K. Koukos [9]
13M. Koutsoureli [4] [10]
14M. Lamhamdi [3] [4]
15T. Lisec [2]
16Antoine Marty [7] [9]
17Mohamed Matmat [7] [9]
18Nicolas Mauran [5] [13]
19S. Mellé [1]
20Nicolas Monnereau [13]
21Nicolas Nolhier [2] [5] [8] [13]
22G. J. Papaioannou [1] [5] [8]
23George Papaioannou [3] [4] [6] [10] [11] [12]
24E. Papandreou [4]
25Robert Plana [1] [2] [3] [4] [5] [6] [7] [8] [10] [11] [12] [13]
26Patrick Pons [1] [3] [4] [6] [10] [11] [12]
27Vincent Puyal [8]
28Jinyu Ruan [2] [4] [5] [8] [13]
29Y. Segui [3]
30V. Theonas [1]
31D. Trémouilles (David Trémouilles) [8] [13]
32C. Villeneuve [8]
33H. Wang [10]
34Usama Zaghloul [3] [6] [10] [11] [12]

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