R. Clerc

	2001
2		R. Clerc, A. S. Spinelli, G. Ghibaudo, Charles Leroux, G. Pananakakis: Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectronics Reliability 41(7): 1027-1030 (2001)
1		P. O'Sullivan, R. Clerc, Kevin G. McCarthy, Alan Mathewson, G. Ghibaudo: Direct tunnelling models for circuit simulation. Microelectronics Reliability 41(7): 951-957 (2001)

Coauthor Index

1	Gérard Ghibaudo (G. Ghibaudo)	[1] [2]
2	Charles Leroux	[2]
3	Alan Mathewson	[1]
4	Kevin G. McCarthy	[1]
5	P. O'Sullivan	[1]
6	G. Pananakakis	[2]
7	A. S. Spinelli	[2]

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