Felipe R. Clayton

	2005
1		Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento: Low Cost BIST for Static and Dynamic Testing of ADCs. J. Electronic Testing 21(3): 283-290 (2005)

Coauthor Index

1	Cristiano Benevento	[1]
2	Luigi Carro	[1]
3	Maria Da Gloria Flores	[1]
4	Marcelo Negreiros	[1]
5	Altamiro Amadeu Susin	[1]

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