Wilfrid Claeys

	2009
13		Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire: Joule expansion imaging techniques on microlectronic devices. Microelectronics Journal 40(9): 1367-1372 (2009)
	2008
12		Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire: Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. European Test Symposium 2008: 47-52
11		Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire: Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectronics Reliability 48(2): 204-211 (2008)
	2006
10		Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
	2005
9		Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire: ElectroStatic Discharge Fault Localization by Laser Probing. Microelectronics Reliability 45(9-11): 1482-1486 (2005)
	2004
8		Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys: Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability 53(2): 293-296 (2004)
7		Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz: Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal 35(10): 797-803 (2004)
6		Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004)
5		Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)
	2003
4		Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys: Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability 43(9-11): 1609-1613 (2003)
3		G. Andriamonje, Vincent Pouget, Y. Ousten, Dean Lewis, Y. Danto, Jean-Michel Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
	2000
2		Josep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys: Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
	1999
1		Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto: Differential Thermal Testing: An Approach to its Feasibility. J. Electronic Testing 14(1-2): 57-66 (1999)

Coauthor Index

1	Eduardo Aldrete-Vidrio	[12]
2	Josep Altet	[1] [2] [5] [12]
3	G. Andriamonje	[3]
4	Jean-Christophe Batsale	[5] [6]
5	Benoît Charlot	[11]
6	L. Clerjaud	[12]
7	Yves Danto (Y. Danto)	[3]
8	Stefan Dilhaire	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
9	Y. Ezzahri	[3]
10	Stéphane Grauby	[3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
11	S. Jorez	[8]
12	Stéphane Lefèvre	[7]
13	Dean Lewis	[3]
14	Luis David Patiño Lopez	[7] [11] [13]
15	Diego Mateo	[12]
16	H. Michel	[10] [12]
17	Y. Ousten (Yves Ousten)	[3]
18	Vincent Pouget	[3]
19	Etienne Puyoo	[13]
20	Jean-Michel Rampnoux	[3] [5] [10] [12] [13]
21	Antonio Rubio	[1] [2] [5] [12]
22	M. Amine Salhi	[4] [7] [9] [10] [11] [12] [13]
23	E. Schaub	[1] [2]
24	Hideo Tamamoto	[1]
25	D. Trias	[9]
26	Sebastian Volz	[7]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page