Cor Claeys

	2012
14		Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, O. Militaru, G. Berger, Denis Flandre: High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs. Microelectronics Reliability 52(1): 118-123 (2012)
13		Renan Trevisoli Doria, João Antonio Martino, Eddy Simoen, Cor Claeys, Marcelo Antonio Pavanello: An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. Microelectronics Reliability 52(3): 519-524 (2012)
	2007
12		Paula Ghedini Der Agopian, João Antonio Martino, Eddy Simoen, Cor Claeys: Study of the linear kink effect in PD SOI nMOSFETs. Microelectronics Journal 38(1): 114-119 (2007)
11		Kerem Akarvardar, Abdelkarim Mercha, Eddy Simoen, Vaidyanathan Subramanian, Cor Claeys, Pierre Gentil, Sorin Cristoloveanu: High-temperature performance of state-of-the-art triple-gate transistors. Microelectronics Reliability 47(12): 2065-2069 (2007)
10		Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, D. Misra, Cor Claeys: Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks. Microelectronics Reliability 47(4-5): 501-504 (2007)
	2006
9		Paula Ghedini Der Agopian, João Antonio Martino, Eddy Simoen, Cor Claeys: Impact of the twin-gate structure on the linear kink effect in PD SOI nMOSFETS. Microelectronics Journal 37(8): 681-685 (2006)
8		L. M. Camillo, João Antonio Martino, Eddy Simoen, Cor Claeys: The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. Microelectronics Journal 37(9): 952-957 (2006)
7		J. M. Rafí, Eddy Simoen, K. Hayama, Abdelkarim Mercha, F. Campabadal, H. Ohyama, Cor Claeys: Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. Microelectronics Reliability 46(9-11): 1657-1663 (2006)
6		K. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectronics Reliability 46(9-11): 1731-1735 (2006)
	2005
5		K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005)
	2004
4		Cor Claeys: Technological Challenges of Advanced CMOS Processing and Their Impact on Design Aspects. VLSI Design 2004: 275-
	2001
3		H. Ohyama, Eddy Simoen, S. Kuroda, Cor Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga: Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. Microelectronics Reliability 41(1): 79-85 (2001)
2		M. Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara: Reliability of polycrystalline silicon thin film resistors. Microelectronics Reliability 41(9-10): 1341-1346 (2001)
1		H. Ohyama, M. Nakabayashi, Eddy Simoen, Cor Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi: Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. Microelectronics Reliability 41(9-10): 1443-1448 (2001)

Coauthor Index

1	Paula Ghedini Der Agopian	[9] [12]
2	Kerem Akarvardar	[11]
3	Joaquín Alvarado	[14]
4	G. Berger	[14]
5	L. M. Camillo	[8]
6	F. Campabadal	[7]
7	Nadine Collaert	[14]
8	Sorin Cristoloveanu	[11]
9	Felice Crupi	[10]
10	Renan Trevisoli Doria	[13]
11	Denis Flandre	[14]
12	Pierre Gentil	[11]
13	T. Hakata	[3]
14	K. Hayama	[5] [6] [7]
15	T. Hirao	[1]
16	M. Ikegami	[2]
17	Valeria Kilchytska	[14]
18	K. Kobayashi	[1] [2] [3]
19	S. Kuboyama	[5]
20	S. Kuroda	[3]
21	Paolo Magnone	[10]
22	João Antonio Martino	[8] [9] [12] [13]
23	S. Matsuda	[5]
24	Abdelkarim Mercha	[5] [6] [7] [11]
25	O. Militaru	[14]
26	D. Misra	[10]
27	K. Miyahara	[2]
28	M. Nakabayashi	[1] [2] [3]
29	H. Ohyama	[1] [2] [3] [5] [6] [7]
30	S. Onada	[1]
31	Calogero Pace	[10]
32	Marcelo Antonio Pavanello	[13]
33	S. Put	[14]
34	J. M. Rafí	[5] [6] [7]
35	K. Shigaki	[6]
36	Eddy Simoen	[1] [2] [3] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14]
37	Paolo Srinivasan	[10]
38	Vaidyanathan Subramanian	[11]
39	H. Sunaga	[3]
40	K. Takakura	[5] [6]
41	Y. Takami	[3]
42	T. Tanaka	[1]
43	M. Yoneoka	[2]

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