Mehmet A. Cirit

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1989

3 Mehmet A. Cirit: The Meyer model revisited: why is charge not conserved? [MOS transistor]. IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1033-1037 (1989)

1988

2 Mehmet A. Cirit: Switch Level Random Pattern Testability Analysis. DAC 1988: 587-590

1987

1 Mehmet A. Cirit: Transistor Sizing in CMOS Circuits. DAC 1987: 121-124

	1989
3		Mehmet A. Cirit: The Meyer model revisited: why is charge not conserved? [MOS transistor]. IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1033-1037 (1989)
	1988
2		Mehmet A. Cirit: Switch Level Random Pattern Testability Analysis. DAC 1988: 587-590
	1987
1		Mehmet A. Cirit: Transistor Sizing in CMOS Circuits. DAC 1987: 121-124

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