C. R. Cirba

	2005
1		P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005)

Coauthor Index

1	P. C. Adell	[1]
2	Hugh J. Barnaby	[1]
3	W. T. Holman	[1]
4	O. Mion	[1]
5	Ronald D. Schrimpf	[1]
6	X. Zhu	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page