| | |
- CSB - MetaPress - Google - Bing - Yahoo
 | 2007 | |
|---|---|---|
| 2 |      | Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas: Processing High Volume Scan Test Results for Yield Learning. ISQED 2007: 293-298 |
| 1996 | ||
| 1 | | Dennis J. Ciplickas, Ronald A. Rohrer: Expected current distributions for CMOS circuits. ICCAD 1996: 589-592 |
| 1 | Phil Burlison | [2] |
| 2 | Alfred L. Crouch (Al Crouch) | [2] |
| 3 | Ronald A. Rohrer | [1] |
Colors in the list of coauthors
Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —
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