 | 2010 |
|---|
| 12 |       | R. Merlino,
Graziella Scandurra,
Carmine Ciofi:
A Very Low Offset Preamplifier for Voltage Measurements in the µV Range.
IEEE T. Instrumentation and Measurement 59(1): 188-194 (2010) |
| 11 | | Carmine Ciofi,
Graziella Scandurra,
Gianluca Cannata:
A New Circuit Topology for the Realization of Very Low Noise, High Stability Voltage Sources.
IEEE T. Instrumentation and Measurement 59(10): 2724-2731 (2010) |
| 2009 |
|---|
| 10 | | Graziella Scandurra,
Carmine Ciofi,
Giuseppe Campobello,
Gianluca Cannata:
On the Calibration of DA Converters Based on R/Beta R Ladder Networks.
IEEE T. Instrumentation and Measurement 58(11): 3901-3906 (2009) |
| 2007 |
|---|
| 9 | | Carmine Ciofi,
Felice Crupi,
Calogero Pace,
Graziella Scandurra,
Maurizio Patane:
A New Circuit Topology for the Realization of Very Low-Noise Wide-Bandwidth Transimpedance Amplifier.
IEEE T. Instrumentation and Measurement 56(5): 1626-1631 (2007) |
| 2006 |
|---|
| 8 | | Giuseppe Campobello,
Marco Castano,
Carmine Ciofi,
Daniele Mangano:
GALS networks on chip: a new solution for asynchronous delay-insensitive links.
DATE Designers' Forum 2006: 160-165 |
| 7 | | Carmine Ciofi,
Felice Crupi,
Calogero Pace,
Graziella Scandurra:
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier.
IEEE T. Instrumentation and Measurement 55(3): 814-819 (2006) |
| 6 | | Felice Crupi,
Gino Giusi,
Carmine Ciofi,
Calogero Pace:
Enhanced sensitivity cross-correlation method for voltage noise measurements.
IEEE T. Instrumentation and Measurement 55(4): 1143-1147 (2006) |
| 5 | | Graziella Scandurra,
Carmine Ciofi,
Gino Giusi,
Marco Castano,
Gianluca Cannata:
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters.
IEEE T. Instrumentation and Measurement 55(6): 2275-2280 (2006) |
| 2003 |
|---|
| 4 | | Calogero Pace,
Carmine Ciofi,
Felice Crupi:
Very low-noise, high-accuracy programmable voltage reference.
IEEE T. Instrumentation and Measurement 52(4): 1251-1254 (2003) |
| 3 | | Carmine Ciofi,
Felice Crupi,
Calogero Pace,
Graziella Scandurra:
Micro-prober for wafer-level low-noise measurements in MOS devices.
IEEE T. Instrumentation and Measurement 52(5): 1533-1536 (2003) |
| 2002 |
|---|
| 2 | | Carmine Ciofi,
Felice Crupi,
Calogero Pace:
A new method for high-sensitivity noise measurements.
IEEE T. Instrumentation and Measurement 51(4): 656-659 (2002) |
| 1 | | Graziella Scandurra,
Carmine Ciofi,
Calogero Pace,
F. Speroni,
F. Alagi:
True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines.
Microelectronics Reliability 42(9-11): 1347-1351 (2002) |
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