Mauro Ciappa

	2011
30		Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner: A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electronic Testing 27(1): 19-30 (2011)
29		Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner: Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. Microelectronics Reliability 51(9-11): 1479-1483 (2011)
28		Aniello Esposito, Mauro Ciappa, Wolfgang Fichtner: Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes. Microelectronics Reliability 51(9-11): 1673-1678 (2011)
	2010
27		Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner: Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. European Test Symposium 2010: 170-174
26		Mauro Ciappa, Alexander Koschik, Maurizio Dapor, Wolfgang Fichtner: Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy. Microelectronics Reliability 50(9-11): 1407-1412 (2010)
25		Yuji Sasaki, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner: Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS. Microelectronics Reliability 50(9-11): 1621-1625 (2010)
24		Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner: A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. Microelectronics Reliability 50(9-11): 1750-1757 (2010)
	2009
23		Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner: Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. European Test Symposium 2009: 67-72
22		Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner: Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices. Microelectronics Reliability 49(9-11): 1278-1282 (2009)
21		Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner: A new built-in screening methodology to achieve zero defects in the automotive environment. Microelectronics Reliability 49(9-11): 1334-1340 (2009)
20		Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner: Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectronics Reliability 49(9-11): 972-976 (2009)
	2008
19		Alberto Castellazzi, Mauro Ciappa: Novel simulation approach for transient analysis and reliable thermal management of power devices. Microelectronics Reliability 48(8-9): 1500-1504 (2008)
	2007
18		Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner: SCR operation mode of diode strings for ESD protection. Microelectronics Reliability 47(7): 1044-1053 (2007)
17		P. Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, J. P. Fradin: Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectronics Reliability 47(9-11): 1343-1348 (2007)
16		D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner: Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectronics Reliability 47(9-11): 1707-1712 (2007)
15		Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet: A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectronics Reliability 47(9-11): 1713-1718 (2007)
14		J. Urresti-Ibañez, Alberto Castellazzi, M. Piton, J. Rebollo, Michel Mermet-Guyennet, Mauro Ciappa: Robustness test and failure analysis of IGBT modules during turn-off. Microelectronics Reliability 47(9-11): 1725-1729 (2007)
	2006
13		Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner: Characterization of photonic devices by secondary electron potential contrast. Microelectronics Reliability 46(9-11): 1536-1541 (2006)
12		Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet: Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectronics Reliability 46(9-11): 1754-1759 (2006)
11		D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006)
	2005
10		Mauro Ciappa: Lifetime prediction on the base of mission profiles. Microelectronics Reliability 45(9-11): 1293-1298 (2005)
9		Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner: Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectronics Reliability 45(9-11): 1499-1504 (2005)
8		Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. Microelectronics Reliability 45(9-11): 1532-1537 (2005)
7		Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe: Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles. Microelectronics Reliability 45(9-11): 1694-1699 (2005)
	2003
6		Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. Microelectronics Reliability 43(9-11): 1651-1656 (2003)
5		G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectronics Reliability 43(9-11): 1771-1776 (2003)
	2002
4		Mauro Ciappa: Selected failure mechanisms of modern power modules. Microelectronics Reliability 42(4-5): 653-667 (2002)
3		Mauro Ciappa, Flavio Carbognani, P. Cova, Wolfgang Fichtner: A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. Microelectronics Reliability 42(9-11): 1653-1658 (2002)
2		Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner: Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectronics Reliability 42(9-11): 1701-1706 (2002)
	2001
1		H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner: Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications. Microelectronics Reliability 41(9-10): 1459-1463 (2001)

Coauthor Index

1	D. Barlini	[11] [16]
2	Marco Buzzo	[2] [9] [13]
3	Flavio Carbognani	[3]
4	Alberto Castellazzi	[11] [12] [14] [15] [17] [19]
5	X. Chauffleur	[17]
6	Paolo Cova (P. Cova)	[3]
7	Maurizio Dapor	[26]
8	Krzysztof Domanski	[18]
9	Kai Esmark	[18]
10	Aniello Esposito	[28]
11	Wolfgang Fichtner	[1] [2] [3] [5] [6] [7] [8] [9] [11] [12] [13] [15] [16] [18] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30]
12	J. P. Fradin	[17]
13	Ulrich Glaser	[18]
14	M. Hommel	[24]
15	T. Kojima	[7]
16	Alexander Koschik	[26]
17	Haruka Kubo	[22]
18	M. Leicht	[2]
19	G. Lourdel	[12]
20	Vezio Malandruccolo	[21] [23] [24] [27] [30]
21	Luigi Mangiacapra	[20] [29]
22	Takayuki Masunaga	[22] [25]
23	Michel Mermet-Guyennet	[11] [12] [14] [15] [16] [17]
24	G. Mura (Giovanna Mura)	[5]
25	Y. Nishibe	[7]
26	Stephan Ott	[20] [29]
27	M. Piton	[14] [15]
28	J. Rebollo	[14]
29	Hubert Rothleitner	[21] [23] [24] [27] [30]
30	Christian Russ	[18]
31	J. Saiz	[17]
32	Yuji Sasaki	[25]
33	P. Solomalala	[17]
34	Maria Stangoni	[2] [5] [6] [8] [9] [20] [29]
35	Martin Streibl	[18]
36	J. Urresti-Ibañez (J. Urresti)	[14]
37	Massimo Vanzi	[5]
38	H. Yabuhara	[1]
39	Y. Yamada	[7]

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