 | 2010 |
|---|
| 4 |       | Kun Young Chung,
Sandeep K. Gupta:
Design and test of latch-based circuits to maximize performance, yield, and delay test quality.
ITC 2010: 94-103 |
| 2009 |
|---|
| 3 | | Kun Young Chung,
Sandeep K. Gupta:
Efficient Scheduling of Path Delay Tests for Latch-Based Circuits.
VTS 2009: 103-110 |
| 2006 |
|---|
| 2 | | Kun Young Chung,
Sandeep K. Gupta:
Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing.
VTS 2006: 8-15 |
| 2003 |
|---|
| 1 | | Kun Young Chung,
Sandeep K. Gupta:
Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing.
ITC 2003: 1089-1097 |
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