 | 2010 |
|---|
| 8 |       | Jae Wook Lee,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
A delay measurement method using a shrinking clock signal.
ACM Great Lakes Symposium on VLSI 2010: 139-142 |
| 7 | | Ji Hwan (Paul) Chun,
Jae Wook Lee,
Jacob A. Abraham:
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection.
ASP-DAC 2010: 312-317 |
| 2009 |
|---|
| 6 | | Jae Wook Lee,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
A Random Jitter RMS Estimation Technique for BIST Applications.
Asian Test Symposium 2009: 9-14 |
| 2007 |
|---|
| 5 | | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Predicting mixed-signal dynamic performance using optimised signature-based alternate test.
IET Computers & Digital Techniques 1(3): 159-169 (2007) |
| 2006 |
|---|
| 4 | | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
European Test Symposium 2006: 199-204 |
| 2004 |
|---|
| 3 | | Ji Hwan (Paul) Chun,
Hak-soo Yu,
Jacob A. Abraham:
An efficient linearity test for on-chip high speed ADC and DAC using loop-back.
ACM Great Lakes Symposium on VLSI 2004: 328-331 |
| 2 | | Hak-soo Yu,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation.
ITC 2004: 1389-1397 |
| 1 | | Ashwin Raghunathan,
Ji Hwan (Paul) Chun,
Jacob A. Abraham,
Abhijit Chatterjee:
Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters.
ITC 2004: 252-261 |
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