![]() | ![]() |
| 2011 | ||
|---|---|---|
| 51 | Vita Pi-Ho Hu, Ming-Long Fan, Pin Su, Ching-Te Chuang: Analysis of power-performance for ultra-thin-body GeOI logic circuits. ISLPED 2011: 115-120 | |
| 50 | Yi-Wei Chiu, Jihi-Yu Lin, Ming-Hsien Tu, Shyh-Jye Jou, Ching-Te Chuang: 8T single-ended sub-threshold SRAM with cross-point data-aware write operation. ISLPED 2011: 169-174 | |
| 49 | Hao-I Yang, Shih-Chi Yang, Mao-Chih Hsia, Yung-Wei Lin, Yi-Wei Lin, Chien-Hen Chen, Chi-Shin Chang, Geng-Cing Lin, Yin-Nien Chen, Ching-Te Chuang, Wei Hwang, Shyh-Jye Jou, Nan-Chun Lien, Hung-Yu Li, Kuen-Di Lee, Wei-Chiang Shih, Ya-Ping Wu, Wen-Ta Lee, Chih-Chiang Hsu: A high-performance low VMIN 55nm 512Kb disturb-free 8T SRAM with adaptive VVSS control. SoCC 2011: 197-200 | |
| 48 | Saibal Mukhopadhyay, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang: SRAM Write-Ability Improvement With Transient Negative Bit-Line Voltage. IEEE Trans. VLSI Syst. 19(1): 24-32 (2011) | |
| 47 | Hao-I Yang, Wei Hwang, Ching-Te Chuang: Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate Devices. IEEE Trans. VLSI Syst. 19(7): 1192-1204 (2011) | |
| 46 | Hao-I Yang, Shyh-Chyi Yang, Wei Hwang, Ching-Te Chuang: Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM. IEEE Trans. on Circuits and Systems 58-I(6): 1239-1251 (2011) | |
| 45 | Hao-I Yang, Wei Hwang, Ching-Te Chuang: Impacts of gate-oxide breakdown on power-gated SRAM. Microelectronics Journal 42(1): 101-112 (2011) | |
| 2010 | ||
| 44 | Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy: Self-Repairing SRAM Using On-Chip Detection and Compensation. IEEE Trans. VLSI Syst. 18(1): 75-84 (2010) | |
| 43 | Ming-Hsien Tu, Jihi-Yu Lin, Ming-Chien Tsai, Shyh-Jye Jou, Ching-Te Chuang: Single-Ended Subthreshold SRAM With Asymmetrical Write/Read-Assist. IEEE Trans. on Circuits and Systems 57-I(12): 3039-3047 (2010) | |
| 2009 | ||
| 42 | Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das: Yield estimation of SRAM circuits using "Virtual SRAM Fab". ICCAD 2009: 631-636 | |
| 41 | Ching-Te Chuang: Modeling, Analysis, and TCAD of Nanoscale Devices and Circuits. ISCAS 2009: 2305-2308 | |
| 40 | Hao-I Yang, Ching-Te Chuang, Wei Hwang: Impacts of NBTI and PBTI on Power-gated SRAM with High-k Metal-gate Devices. ISCAS 2009: 377-380 | |
| 39 | Amlan Ghosh, Richard B. Brown, Rahul M. Rao, Ching-Te Chuang: A Precise Negative Bias Temperature Instability Sensor using Slew-rate Monitor Circuitry. ISCAS 2009: 381-384 | |
| 38 | Vita Pi-Ho Hu, Yu-Sheng Wu, Ming-Long Fan, Pin Su, Ching-Te Chuang: Design and analysis of ultra-thin-body SOI based subthreshold SRAM. ISLPED 2009: 9-14 | |
| 37 | Jihi-Yu Lin, Ming-Hsien Tu, Ming-Chien Tsai, Shyh-Jye Jou, Ching-Te Chuang: Asymmetrical Write-assist for single-ended SRAM operation. SoCC 2009: 101-104 | |
| 36 | Aditya Bansal, Rahul M. Rao, Jae-Joon Kim, Sufi Zafar, James H. Stathis, Ching-Te Chuang: Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability. Microelectronics Reliability 49(6): 642-649 (2009) | |
| 2008 | ||
| 35 | Aditya Bansal, Rama N. Singh, Saibal Mukhopadhyay, Geng Han, Fook-Luen Heng, Ching-Te Chuang: Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield. ICCD 2008: 457-462 | |
| 34 | Saibal Mukhopadhyay, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang: Capacitive coupling based transient negative bit-line voltage (Tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies. ISCAS 2008: 384-387 | |
| 33 | Saibal Mukhopadhyay, Rajiv V. Joshi, Keunwoo Kim, Ching-Te Chuang: Variability Analysis for sub-100nm PD/SOI Sense-Amplifier. ISQED 2008: 488-491 | |
| 32 | Amlan Ghosh, Rahul M. Rao, Ching-Te Chuang, Richard B. Brown: On-Chip Process Variation Detection and Compensation Using Delay and Slew-Rate Monitoring Circuits. ISQED 2008: 815-820 | |
| 31 | Aditya Bansal, Jae-Joon Kim, Keunwoo Kim, Saibal Mukhopadhyay, Ching-Te Chuang, Kaushik Roy: Optimal Dual-VT Design in Sub-100 Nanometer PDSOI and Double-Gate Technologies. VLSI Design 2008: 125-130 | |
| 30 | Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown: On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit. VLSI Design 2008: 143-149 | |
| 29 | Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy: Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. VTS 2008: 101-106 | |
| 28 | Jente B. Kuang, Keunwoo Kim, Ching-Te Chuang, Hung C. Ngo, Fadi H. Gebara, Kevin J. Nowka: Circuit Techniques Utilizing Independent Gate Control in Double-Gate Technologies. IEEE Trans. VLSI Syst. 16(12): 1657-1665 (2008) | |
| 27 | Koushik K. Das, Ching-Te Chuang, Richard B. Brown: Reducing parasitic BJT effects in partially depleted SOI digital logic circuits. Microelectronics Journal 39(2): 275-285 (2008) | |
| 2007 | ||
| 26 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang: Design and analysis of Thin-BOX FD/SOI devices for low-power and stable SRAM in sub-50nm technologies. ISLPED 2007: 20-25 | |
| 25 | Rajiv V. Joshi, Rouwaida Kanj, Keunwoo Kim, Richard Q. Williams, Ching-Te Chuang: A floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies. ISLPED 2007: 8-13 | |
| 24 | Jie Deng, Keunwoo Kim, Ching-Te Chuang, H.-S. Philip Wong: Device Footprint Scaling for Ultra Thin Body Fully Depleted SOI. ISQED 2007: 145-152 | |
| 23 | Rajiv V. Joshi, Keunwoo Kim, Richard Q. Williams, Edward J. Nowak, Ching-Te Chuang: A High-Performance, Low Leakage, and Stable SRAM Row-Based Back-Gate Biasing Scheme in FinFET Technology. VLSI Design 2007: 665-672 | |
| 22 | Saibal Mukhopadhyay, Keunwoo Kim, Jae-Joon Kim, Shih-Hsien Lo, Rajiv V. Joshi, Ching-Te Chuang, Kaushik Roy: Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50nm double gate devices. Microelectronics Journal 38(8-9): 931-941 (2007) | |
| 2006 | ||
| 21 | Koushik K. Das, Shih-Hsien Lo, Ching-Te Chuang: High Performance MTCMOS Technique for Leakage Reduction in Hybrid SOI-Epitaxial Technologies with Enhanced-Mobility PFET Header. VLSI Design 2006: 758-761 | |
| 20 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang, Kaushik Roy: Modeling and Analysis of Leakage Currents in Double-Gate Technologies. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2052-2061 (2006) | |
| 2005 | ||
| 19 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang, Kaushik Roy: Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits. ISLPED 2005: 8-13 | |
| 18 | Saibal Mukhopadhyay, Keunwoo Kim, Jae-Joon Kim, Shih-Hsien Lo, Rajiv V. Joshi, Ching-Te Chuang, Kaushik Roy: Modeling and Analysis of Gate Leakage in Ultra-thin Oxide Sub-50nm Double Gate Devices and Circuits. ISQED 2005: 410-415 | |
| 17 | Rajiv V. Joshi, S. S. Kang, N. Zamdmar, A. Mocuta, Ching-Te Chuang, J. A. Pascual-Gutiérrez: Direct Temperature Measurement for VLSI Circuits and 3-D Modeling of Self-Heating in Sub-0.13 mum SOI Technologies. VLSI Design 2005: 697-702 | |
| 2004 | ||
| 16 | Keunwoo Kim, Koushik K. Das, Rajiv V. Joshi, Ching-Te Chuang: Nanoscale CMOS circuit leakage power reduction by double-gate device. ISLPED 2004: 102-107 | |
| 15 | Rajiv V. Joshi, K. Kroell, Ching-Te Chuang: A Novel Technique For Steady State Analysis For VLSI Circuits In Partially Depleted SOI. VLSI Design 2004: 832- | |
| 2003 | ||
| 14 | Kerry Bernstein, Ching-Te Chuang, Rajiv V. Joshi, Ruchir Puri: Design and CAD Challenges in sub-90nm CMOS Technologies. ICCAD 2003: 129-137 | |
| 13 | Koushik K. Das, Rajiv V. Joshi, Ching-Te Chuang, Peter W. Cook, Richard B. Brown: New optimal design strategies and analysis of ultra-low leakage circuits for nano-scale SOI technology. ISLPED 2003: 168-171 | |
| 12 | Keunwoo Kim, Rajiv V. Joshi, Ching-Te Chuang: Strained-si devices and circuits for low-power applications. ISLPED 2003: 180-183 | |
| 11 | Ching-Te Chuang, Rajiv V. Joshi, Ruchir Puri, Keunwoo Kim: Design Considerations of Scaled Sub-0.1 ?m PD/SOI CMOS Circuits. ISQED 2003: 153-158 | |
| 10 | Rajiv V. Joshi, Ching-Te Chuang, S. K. H. Fung, Fari Assaderaghi, Melanie Sherony, I. Yang, Ghavam V. Shahidi: PD/SOI SRAM performance in presence of gate-to-body tunneling current. IEEE Trans. VLSI Syst. 11(6): 1106-1113 (2003) | |
| 9 | R. Rodríguez, James H. Stathis, Barry P. Linder, Rajiv V. Joshi, Ching-Te Chuang: Influence and model of gate oxide breakdown on CMOS inverters. Microelectronics Reliability 43(9-11): 1439-1444 (2003) | |
| 2002 | ||
| 8 | R. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002) | |
| 2001 | ||
| 7 | Rajiv V. Joshi, Wei Hwang, Ching-Te Chuang: SOI for asynchronous dynamic circuits. ACM Great Lakes Symposium on VLSI 2001: 37-42 | |
| 2000 | ||
| 6 | Rajiv V. Joshi, Wei Hwang, S. C. Wilson, Ching-Te Chuang: "Cool low power" 1GHz multi-port register file and dynamic latch in 1.8 V, 0.25 mum SOI and bulk technology (poster session). ISLPED 2000: 203-206 | |
| 5 | Rajiv V. Joshi, Wei Hwang, S. C. Wilson, Ghavam V. Shahidi, Ching-Te Chuang: A Low Power 900 MHz Register File (8 Ports, 32 Words x 64 Bits) in 1.8V, 0.25µm SOI Technology. VLSI Design 2000: 44-49 | |
| 4 | Ruchir Puri, Ching-Te Chuang: SOI Digital Circuits: Design Issues. VLSI Design 2000: 474-479 | |
| 1999 | ||
| 3 | Ching-Te Chuang, Ruchir Puri: SOI Digital CMOS VLSI - a Design Perspective. DAC 1999: 709-714 | |
| 2 | Ruchir Puri, Ching-Te Chuang: Hysteresis effect in floating-body partially-depleted SOI CMOS domino circuits. ISLPED 1999: 223-228 | |
| 1997 | ||
| 1 | Leon J. Sigal, James D. Warnock, Brian W. Curran, Yuen H. Chan, Peter J. Camporese, Mark D. Mayo, William V. Huott, Daniel R. Knebel, Ching-Te Chuang, James P. Eckhardt, Philip T. Wu: Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor. IBM Journal of Research and Development 41(4&5): 489-504 (1997) | |
Colors in the list of coauthors
Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page