 | 2011 |
|---|
| 9 |       | Stelios Neophytou,
Kyriakos Christou,
Maria K. Michael:
An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration.
European Test Symposium 2011: 141-146 |
| 2010 |
|---|
| 8 | | Kyriakos Christou,
Maria K. Michael,
Stelios Neophytou:
Identification of critical primitive path delay faults without any path enumeration.
VTS 2010: 9-14 |
| 2009 |
|---|
| 7 | | Stelios Neophytou,
Maria K. Michael,
Kyriakos Christou:
Generating Diverse Test Sets for Multiple Fault Detections Based on Fault Cone Partitioning.
DFT 2009: 401-409 |
| 2008 |
|---|
| 6 | | Paolo Bernardi,
Kyriakos Christou,
Michelangelo Grosso,
Maria K. Michael,
Ernesto Sánchez,
Matteo Sonza Reorda:
Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors.
EvoWorkshops 2008: 224-234 |
| 5 | | Kyriakos Christou,
Maria K. Michael,
Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions.
VTS 2008: 389-394 |
| 4 | | Kyriakos Christou,
Maria K. Michael,
Spyros Tragoudas:
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation.
J. Electronic Testing 24(1-3): 203-222 (2008) |
| 2006 |
|---|
| 3 | | Kyriakos Christou,
Maria K. Michael,
Spyros Tragoudas:
Implicit Critical PDF Test Generation with Maximal Test Efficiency.
DFT 2006: 50-58 |
| 2005 |
|---|
| 2 | | Maria K. Michael,
Kyriakos Christou,
Spyros Tragoudas:
Towards finding path delay fault tests with high test efficiency using ZBDDs.
ICCD 2005: 464-467 |
| 2003 |
|---|
| 1 | | Oleg Sokolsky,
Anna Philippou,
Insup Lee,
Kyriakos Christou:
Modeling and Analysis of Power-Aware Systems.
TACAS 2003: 409-425 |
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