Jun-Ho Choy

	2012
2		Valeriy Sukharev, Armen Kteyan, Jun-Ho Choy, Henrik Hovsepyan, Ara Markosian, Ehrenfried Zschech, Rene Huebner: Multi-scale Simulation Methodology for Stress Assessment in 3D IC: Effect of Die Stacking on Device Performance. J. Electronic Testing 28(1): 63-72 (2012)
	2009
1		Valeriy Sukharev, Ara Markosian, Armen Kteyan, Levon Manukyan, Nikolay Khachatryan, Jun-Ho Choy, Hasmik Lazaryan, Henrik Hovsepyan, Seiji Onoue, Takuo Kikuchi, Tetsuya Kamigaki: Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation. ISQED 2009: 156-161

Coauthor Index

1	Henrik Hovsepyan	[1] [2]
2	Rene Huebner	[2]
3	Tetsuya Kamigaki	[1]
4	Nikolay Khachatryan	[1]
5	Takuo Kikuchi	[1]
6	Armen Kteyan	[1] [2]
7	Hasmik Lazaryan	[1]
8	Levon Manukyan	[1]
9	Ara Markosian	[1] [2]
10	Seiji Onoue	[1]
11	Valeriy Sukharev	[1] [2]
12	Ehrenfried Zschech	[2]

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