 | 2011 |
| 22 |  | Vineeth Veetil,
Kaviraj Chopra,
David Blaauw,
Dennis Sylvester:
Fast Statistical Static Timing Analysis Using Smart Monte Carlo Techniques.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(6): 852-865 (2011) |
| 21 |  | Cheng Zhuo,
Kaviraj Chopra,
Dennis Sylvester,
David Blaauw:
Process Variation and Temperature-Aware Full Chip Oxide Breakdown Reliability Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(9): 1321-1334 (2011) |
| 2010 |
| 20 |  | Ravikishore Gandikota,
Kaviraj Chopra,
David Blaauw,
Dennis Sylvester:
Victim Alignment in Crosstalk-Aware Timing Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 29(2): 261-274 (2010) |
| 2008 |
| 19 |  | Brian Cline,
Kaviraj Chopra,
David Blaauw,
Andres Torres,
Savithri Sundareswaran:
Transistor-Specific Delay Modeling for SSTA.
DATE 2008: 592-597 |
| 18 |  | Kaviraj Chopra,
Cheng Zhuo,
David Blaauw,
Dennis Sylvester:
A statistical approach for full-chip gate-oxide reliability analysis.
ICCAD 2008: 698-705 |
| 17 |  | Ashish Srivastava,
Kaviraj Chopra,
Saumil Shah,
Dennis Sylvester,
David Blaauw:
A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 272-285 (2008) |
| 16 |  | David Blaauw,
Kaviraj Chopra,
Ashish Srivastava,
Louis Scheffer:
Statistical Timing Analysis: From Basic Principles to State of the Art.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(4): 589-607 (2008) |
| 2007 |
| 15 |  | Ravikishore Gandikota,
Kaviraj Chopra,
David Blaauw,
Dennis Sylvester,
Murat R. Becer:
Top-k Aggressors Sets in Delay Noise Analysis.
DAC 2007: 174-179 |
| 14 |  | Ravikishore Gandikota,
Kaviraj Chopra,
David Blaauw,
Dennis Sylvester,
Murat R. Becer,
Joao Geada:
Victim alignment in crosstalk aware timing analysis.
ICCAD 2007: 698-704 |
| 13 |  | Aseem Agarwal,
Kaviraj Chopra,
David Blaauw:
Statistical Timing Based Optimization using Gate Sizing
CoRR abs/0710.4697: (2007) |
| 12 |  | Rajeev R. Rao,
Kaviraj Chopra,
David T. Blaauw,
Dennis Sylvester:
Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 468-479 (2007) |
| 2006 |
| 11 |  | Rajeev R. Rao,
Kaviraj Chopra,
David Blaauw,
Dennis Sylvester:
An efficient static algorithm for computing the soft error rates of combinational circuits.
DATE 2006: 164-169 |
| 10 |  | Kaviraj Chopra,
Bo Zhai,
David Blaauw,
Dennis Sylvester:
A new statistical max operation for propagating skewness in statistical timing analysis.
ICCAD 2006: 237-243 |
| 9 |  | Brian Cline,
Kaviraj Chopra,
David Blaauw,
Yu Cao:
Analysis and modeling of CD variation for statistical static timing.
ICCAD 2006: 60-66 |
| 8 |  | Kaviraj Chopra,
Sarma B. K. Vrudhula:
Efficient Symbolic Algorithms for Computing the Minimum and Bounded Leakage States.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2820-2832 (2006) |
| 2005 |
| 7 |  | Aseem Agarwal,
Kaviraj Chopra,
David Blaauw,
Vladimir Zolotov:
Circuit optimization using statistical static timing analysis.
DAC 2005: 321-324 |
| 6 |  | David Blaauw,
Kaviraj Chopra:
CAD tools for variation tolerance.
DAC 2005: 766 |
| 5 |  | Aseem Agarwal,
Kaviraj Chopra,
David Blaauw:
Statistical Timing Based Optimization using Gate Sizing.
DATE 2005: 400-405 |
| 4 |  | Kaviraj Chopra,
Saumil Shah,
Ashish Srivastava,
David Blaauw,
Dennis Sylvester:
Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation.
ICCAD 2005: 1023-1028 |
| 2004 |
| 3 |  | Kaviraj Chopra,
Sarma B. K. Vrudhula:
Implicit pseudo boolean enumeration algorithms for input vector control.
DAC 2004: 767-772 |
| 2 |  | Sridhar Dasika,
Sarma B. K. Vrudhula,
Kaviraj Chopra,
R. Srinivasan:
A Framework for Battery-Aware Sensor Management.
DATE 2004: 962-967 |
| 1 |  | Kaviraj Chopra,
Sarma B. K. Vrudhula,
Sarvesh Bhardwaj:
Efficient Algorithms for Identifying the Minimum Leakage States in CMOS Combinational Logic.
VLSI Design 2004: 240- |