T. W. Choi

	2000
1		D. H. Ryu, T. W. Choi, Y. I. Kim, S. H. Nahm: Measurement of the fatigue-crack using image processing techniques. KES 2000: 121-124

Coauthor Index

1	Y. I. Kim	[1]
2	S. H. Nahm	[1]
3	D. H. Ryu	[1]

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