Seongjin Choi

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2009

3 Byungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)

2 Byungwhan Kim, Jeong Kim, Seongjin Choi: Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment. Expert Syst. Appl. 36(8): 11347-11351 (2009)

2007

1 Byungwhan Kim, Seongjin Choi: Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process. ISNN (1) 2007: 602-608

	2009
3		Byungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)
2		Byungwhan Kim, Jeong Kim, Seongjin Choi: Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment. Expert Syst. Appl. 36(8): 11347-11351 (2009)
	2007
1		Byungwhan Kim, Seongjin Choi: Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process. ISNN (1) 2007: 602-608

Coauthor Index

1 Byungwhan Kim [1] [2] [3]

2 Jeong Kim [2]

3 Hee Ju Kwon [3]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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