Munkang Choi

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2008

3 Munkang Choi, Linda S. Milor: Diagnosis of Optical Lithography Faults With Product Test Sets. IEEE Trans. on CAD of Integrated Circuits and Systems 27(9): 1657-1669 (2008)

2006

2 Munkang Choi, Linda S. Milor: Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1350-1367 (2006)

2005

1 Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005)

	2008
3		Munkang Choi, Linda S. Milor: Diagnosis of Optical Lithography Faults With Product Test Sets. IEEE Trans. on CAD of Integrated Circuits and Systems 27(9): 1657-1669 (2008)
	2006
2		Munkang Choi, Linda S. Milor: Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1350-1367 (2006)
	2005
1		Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005)

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