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| 2011 | ||
|---|---|---|
| 40 | Minsu Choi, Jinsang Kim, Won-Kyung Cho, Jinwook Burm: Area-efficient fast scheduling schemes for MVC prediction architecture. ISCAS 2011: 575-578 | |
| 39 | Wonhak Hong, Rajashekhar Modugu, Minsu Choi: Efficient Online Self-Checking Modulo 2^n+1 Multiplier Design. IEEE Trans. Computers 60(9): 1354-1365 (2011) | |
| 2010 | ||
| 38 | Janardhanan S. Ajit, Yong-Bin Kim, Minsu Choi: Performance assessment of analog circuits with carbon nanotube FET (CNFET). ACM Great Lakes Symposium on VLSI 2010: 163-166 | |
| 37 | Jun Wu, Yong-Bin Kim, Minsu Choi: Low-power side-channel attack-resistant asynchronous S-box design for AES cryptosystems. ACM Great Lakes Symposium on VLSI 2010: 459-464 | |
| 36 | HeungJun Jeon, Yong-Bin Kim, Minsu Choi: Standby Leakage Power Reduction Technique for Nanoscale CMOS VLSI Systems. IEEE T. Instrumentation and Measurement 59(5): 1127-1133 (2010) | |
| 35 | Tao Feng, Noh-Jin Park, Minsu Choi, Nohpill Park: Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design. IEEE T. Instrumentation and Measurement 59(7): 1812-1824 (2010) | |
| 2009 | ||
| 34 | Minsu Choi, Fabrizio Lombardi, Nohpill Park: Introduction to the Special Section on Nanocircuits and Systems. IEEE Trans. VLSI Syst. 17(4): 470-472 (2009) | |
| 2008 | ||
| 33 | Myungsu Choi, Minsu Choi: Scalability of Globally Asynchronous QCA (Quantum-Dot Cellular Automata) Adder Design. J. Electronic Testing 24(1-3): 313-320 (2008) | |
| 32 | Nur A. Touba, Adelio Salsano, Minsu Choi: Guest Editorial. J. Electronic Testing 24(1-3): 9-10 (2008) | |
| 31 | Yadunandana Yellambalase, Minsu Choi: Cost-driven repair optimization of reconfigurable nanowire crossbar systems with clustered defects. Journal of Systems Architecture - Embedded Systems Design 54(8): 729-741 (2008) | |
| 2007 | ||
| 30 | Ravi Bonam, Yong-Bin Kim, Minsu Choi: Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture. DFT 2007: 161-169 | |
| 29 | Kyung Ki Kim, Yong-Bin Kim, Minsu Choi, Nohpill Park: Leakage Minimization Technique for Nanoscale CMOS VLSI. IEEE Design & Test of Computers 24(4): 322-330 (2007) | |
| 28 | Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing. IEEE T. Instrumentation and Measurement 56(3): 1094-1100 (2007) | |
| 27 | Myungsu Choi, Zachary D. Patitz, Byoungjae Jin, Feng Tao, Nohpill Park, Minsu Choi: Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony. Journal of Systems Architecture 53(9): 551-567 (2007) | |
| 2006 | ||
| 26 | Minsu Choi, Myungsu Choi, Zachary D. Patitz, Nohpill Park: Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design. DFT 2006: 80-88 | |
| 25 | Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim: Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects. DFT 2006: 98-106 | |
| 24 | Jong-Won Park, Chang-Soo Kim, Minsu Choi: Oxidase-coupled amperometric glucose and lactate sensors with integrated electrochemical actuation system. IEEE T. Instrumentation and Measurement 55(4): 1348-1355 (2006) | |
| 2005 | ||
| 23 | Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228 | |
| 22 | Minsu Choi, Nohpill Park: Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata. MSE 2005: 29-30 | |
| 21 | Noh-Jin Park, K. M. George, Nohpill Park, Minsu Choi, Yong-Bin Kim, Fabrizio Lombardi: Environmental-based characterization of SoC-based instrumentation systems for stratified testing. IEEE T. Instrumentation and Measurement 54(3): 1241-1248 (2005) | |
| 20 | Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Reliability measurement of mass storage system for onboard instrumentation. IEEE T. Instrumentation and Measurement 54(6): 2297-2304 (2005) | |
| 2004 | ||
| 19 | Shanrui Zhang, Minsu Choi, Nohpill Park: Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme. DFT 2004: 356-364 | |
| 18 | Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. DFT 2004: 48-56 | |
| 17 | Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Evaluating the repair of system-on-chip (SoC) using connectivity. IEEE T. Instrumentation and Measurement 53(6): 1464-1472 (2004) | |
| 16 | Bin Liu, Fabrizio Lombardi, Nohpill Park, Minsu Choi: Testing Layered Interconnection Networks. IEEE Trans. Computers 53(6): 710-722 (2004) | |
| 15 | Minsu Choi, Nohpill Park, Vincenzo Piuri, Yong-Bin Kim, Fabrizio Lombardi: Balanced dual-stage repair for dependable embedded memory cores. Journal of Systems Architecture 50(5): 281-285 (2004) | |
| 2003 | ||
| 14 | Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi: Regressive Testing for System-on-Chip with Unknown-Good-Yield. DFT 2003: 393-400 | |
| 13 | Minsu Choi, Hardy J. Pottinger, Nohpill Park, Yong-Bin Kim: Need For Undergraduate And Graduate-Level Education In Testing Of Microelectronic Circuits And Systems. MSE 2003: 121-122 | |
| 12 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Optimal Spare Utilization in Repairable and Reliable Memory Cores. MTDT 2003: 64-71 | |
| 11 | Minsu Choi, Noh-Jin Park, K. M. George, Byoungjae Jin, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems. NCA 2003: 341- | |
| 10 | Satish K. Bandapati, Scott C. Smith, Minsu Choi: Design and Characterization of Null Convention Self-Timed Multipliers. IEEE Design & Test of Computers 20(6): 26-36 (2003) | |
| 9 | Minsu Choi, Nohpill Park, Fabrizio Lombardi: Modeling and analysis of fault tolerant multistage interconnection networks. IEEE T. Instrumentation and Measurement 52(5): 1509-1519 (2003) | |
| 8 | Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary: Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems. IEEE T. Instrumentation and Measurement 52(6): 1713-1721 (2003) | |
| 2002 | ||
| 7 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. DFT 2002: 419-427 | |
| 6 | Y. Chang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Repairability Evaluation of Embedded Multiple Region DRAMs. DFT 2002: 428-436 | |
| 5 | Minsu Choi, Nohpill Park, Fabrizio Lombardi: Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems. IPDPS 2002 | |
| 4 | Minsu Choi, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Hardware/Software Co-Reliability of Configurable Digital Systems. PRDC 2002: 67-74 | |
| 3 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri: Quality enhancement of reconfigurable multichip module systems by redundancy utilization. IEEE T. Instrumentation and Measurement 51(4): 740-749 (2002) | |
| 2 | Minsu Choi, Nohpill Park: Dynamic yield analysis and enhancement of FPGA reconfigurable memory systems. IEEE T. Instrumentation and Measurement 51(6): 1300-1311 (2002) | |
| 2001 | ||
| 1 | Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26 | |
Colors in the list of coauthors
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