 | 2010 |
|---|
| 4 |       | Jin-Young Kim,
Jun-Seok Oh,
Won-Ju Cho,
Jong-Tae Park:
NBTI and hot carrier effect of Schottky-barrier p-MOSFETs.
Microelectronics Reliability 50(9-11): 1290-1293 (2010) |
| 2009 |
|---|
| 3 | | Yong Woo Jeon,
Dae Hyun Ka,
Chong-Gun Yu,
Won-Ju Cho,
M. Saif Islam,
Jong-Tae Park:
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer.
Microelectronics Reliability 49(9-11): 994-997 (2009) |
| 2008 |
|---|
| 2 | | Dong Uk Lee,
Seon Pil Kim,
Tae Hee Lee,
Eun Kyu Kim,
Hyun-Mo Koo,
Won-Ju Cho,
Young-Ho Kim:
Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In2O3 Nano-Particles Embedded in Polyimide Insulator.
IEICE Transactions 91-C(5): 747-750 (2008) |
| 2007 |
|---|
| 1 | | Sung Jun Jang,
Dae Hyun Ka,
Chong-Gun Yu,
Kwan-Su Kim,
Won-Ju Cho,
Jong-Tae Park:
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs.
Microelectronics Reliability 47(9-11): 1411-1415 (2007) |
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