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| 1999 | ||
|---|---|---|
| 1 | Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner: An accurate simulation model of the ATE test environment for very high speed devices. ITC 1999: 524-531 | |
| 1 | Yi Cai | [1] |
| 2 | Bill Ortner | [1] |
| 3 | Thomas P. Warwick | [1] |
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