 | 2007 |
| 3 |  | Fu-Chien Chiu,
Wen-Chieh Shih,
Joseph Ya-min Lee,
Huey-Liang Hwang:
An investigation of surface state capture cross-sections for metal-oxide-semiconductor field-effect transistors using HfO2 gate dielectrics.
Microelectronics Reliability 47(4-5): 548-551 (2007) |
| 2005 |
| 2 |  | Fu-Chien Chiu,
Shun-An Lin,
Joseph Ya-min Lee:
Electrical properties of metal-HfO2-silicon system measured from metal-insulator-semiconductor capacitors and metal-insulator-semiconductor field-effect transistors using HfO2 gate dielectric.
Microelectronics Reliability 45(5-6): 961-964 (2005) |
| 2004 |
| 1 |  | Chih-Yao Huang,
Wei-Fang Chen,
Song-Yu Chuan,
Fu-Chien Chiu,
Jeng-Chou Tseng,
I-Cheng Lin,
Chuan-Jane Chao,
Len-Yi Leu,
Ming-Dou Ker:
Design optimization of ESD protection and latchup prevention for a serial I/O IC.
Microelectronics Reliability 44(2): 213-221 (2004) |