L. Y. Ching

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2001

1 Karlheinz Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001)

	2001
1		Karlheinz Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001)

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