James Chin

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2005

4 James Chin, Mehrdad Nourani: FITS: An Integrated ILP-Based Test Scheduling Environment. IEEE Trans. Computers 54(12): 1598-1613 (2005)

2004

3 James Chin, Mehrdad Nourani: SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance. DATE 2004: 710-711

2003

2 Mehrdad Nourani, James Chin: Power-Time Tradeoff in Test Scheduling for SoCs. ICCD 2003: 548-553

2002

1 Mehrdad Nourani, James Chin: Testing High-Speed SoCs Using Low-Speed ATEs. VTS 2002: 133-138

	2005
4		James Chin, Mehrdad Nourani: FITS: An Integrated ILP-Based Test Scheduling Environment. IEEE Trans. Computers 54(12): 1598-1613 (2005)
	2004
3		James Chin, Mehrdad Nourani: SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance. DATE 2004: 710-711
	2003
2		Mehrdad Nourani, James Chin: Power-Time Tradeoff in Test Scheduling for SoCs. ICCD 2003: 548-553
	2002
1		Mehrdad Nourani, James Chin: Testing High-Speed SoCs Using Low-Speed ATEs. VTS 2002: 133-138

Coauthor Index

1 Mehrdad Nourani [1] [2] [3] [4]

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