Cary K. Chin

	1987
3		Cary K. Chin, Edward J. McCluskey: Test Length for Pseudorandom Testing. IEEE Trans. Computers 36(2): 252-256 (1987)
2		Kenneth D. Wagner, Cary K. Chin, Edward J. McCluskey: Pseudorandom Testing. IEEE Trans. Computers 36(3): 332-343 (1987)
	1985
1		Cary K. Chin, Edward J. McCluskey: Test Length for Pseudo Random Testing. ITC 1985: 94-99

Coauthor Index

1	Edward J. McCluskey	[1] [2] [3]
2	Kenneth D. Wagner	[2]

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