 | 2010 |
|---|
| 5 |       | Wei-Ting Kary Chien,
S. F. Yang:
A Practical, Innovative Method for Electro-Static Discharge Data Analysis.
IEEE Transactions on Reliability 59(2): 440-446 (2010) |
| 2007 |
|---|
| 4 | | Wei-Ting Kary Chien,
S. F. Yang:
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing.
IEEE Transactions on Reliability 56(1): 69-76 (2007) |
| 2004 |
|---|
| 3 | | Summer F. C. Tseng,
Wei-Ting Kary Chien,
Excimer Gong,
Willings Wang,
Bing-Chu Cai:
Some practical considerations for effective and efficient wafer-level reliability control.
Microelectronics Reliability 44(8): 1233-1243 (2004) |
| 2003 |
|---|
| 2 | | Summer Fan-Chung Tseng,
Wei-Ting Kary Chien,
Excimer Gong,
Bing-Chu Cai:
A cost-effective wafer-level reliability test system for integrated circuit makers.
IEEE T. Instrumentation and Measurement 52(5): 1458-1467 (2003) |
| 1 | | Summer F. C. Tseng,
Wei-Ting Kary Chien,
Bing-Chu Cai:
Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation.
Microelectronics Reliability 43(5): 713-724 (2003) |
Data released under the ODC-BY 1.0 license — See also our legal information page